Surface Analysis

Surface analysis encompasses a range of techniques used to characterize the surface properties, morphology, and composition of materials at micro- and nanoscale levels.
As a leading manufacturer of surface analysis instruments, Shimadzu provides innovative technologies and total solutions to meet diverse surface characterization and analysis needs.
The Shimadzu surface analysis portfolio includes high-resolution scanning probe microscopes (SPM)/atomic force microscopes (AFM), electron probe micro-analyzers (EPMA), X-ray photoelectron spectrometers (XPS)/electron spectroscopy for chemical analysis (ESCA), scanning electron microscopes (SEM), and focused ion beam-scanning electron microscope (FIB-SEM) systems, enabling seamless workflows from surface analysis and elemental characterization to high-resolution imaging, three-dimensional structural analysis, cross-sectional observation, and site-specific sample preparation. These instruments are utilized across a wide range of applications such as steel, non-ferrous metals, environmental, food, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers.
By advanced surface analysis technologies, Shimadzu empowers researchers and industry professionals to gain deeper insights into material properties, structures and performance.
Learn more about our full lineup below.