Surface Analysis
Surface analysis is a technique used to analyze only the thin surface layer of a solid.
As a leading manufacturer of surface analysis instruments, we confidently provide innovative instruments and solutions to meet your surface measurement and analysis needs.
The Shimadzu surface analysis instrument portfolio includes high-resolution scanning probe microscopes (SPM)/atomic force microscopes (AFM), electron probe micro-analyzers (EPMA), and X-ray photoelectron spectrometers (XPS)/electron spectroscopy for chemical analysis (ESCA). These instruments are utilized in a wide range of applications such as steel, non-ferrous metals, environmental, food, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. Among this portfolio, we provide the SPM-Nanoa microscope, featuring powerful tools for observing the shape of micro areas and measuring their physical properties; the EPMA-8050G, which boasts unprecedented spatial resolution under all beam current conditions from SEM observation conditions to 1 μA order; and the AXIS Supra+ X-ray photoelectron spectrometer, which combines state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available.
Learn more about our full lineup below.
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High-Resolution Scanning Probe Microscopes Comparison
This page provides a quick overview of 3 models of high-resolution Scanning Probe Microscopes . Choose the model that best suits your analysis needs from our multi-function, automatic observation, and research-grade high-resolution models.
SPM-9700HT Plus
Making the Unknown Visible. The SPM-9700HT Plus takes high-throughput observations to the next level.
SPM-8100FM
This instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
SPM-Nanoa
SPM-Nanoa microscopes include an advanced high-sensitivity detection system and automatic viewing functionality as standard features. That means you can observe what you want to observe in more detail, more easily, and more quickly. Consequently, SPM-Nanoa microscopes provide powerful assistance for everything from observing the shape of micro areas to measuring their physical properties.
Particle Analysis Software
This application software can be used for a wide range of samples, from soft to hard materials, to provide powerful help for observing what you want to observe.
EPMA-8050G
This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order.
EPMA-1720
Both hardware and software incorporate the latest technologies to create the next generation of EPMA.
AXIS Supra+
The AXIS Supra+ (also known as Kratos Ultra 2 in Japan) is a market leading X-ray photoelectron spectrometer combining state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available.
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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