Variable Angle Absolute Reflectance System for SolidSpect-3700

Introduction

Use of a variable angle absolute reflectance attachment allows measurement of the absolute reflectance at any desired angle of incidence (5 ̊ to 70 ̊). This Application News introduces the measurement results of the absolute reflectance of a silicon wafer’s mirror-polished surface at various incident angles using the SolidSpec-3700 UV-VIS-IR spectrophotometer with an installed variable angle absolute reflectance attachment.

July 12, 2007 GMT