Analysis of CIGS Solar Cell by ICPE-9000

Introduction

Solar cells based on compounds that do not include silicon are receiving increased attention. The CIGS solar cell that uses Cu, In, Ga and Se is one such example. The ratio of these substances is important from the standpoint of improving power generation efficiency. An EDX (energy dispersive X-ray fluorescence spectrometer) allows nondestructive, direct measurement of this CIGS thin film, but when accuracy becomes a priority, a more reliable method of quantitation is by putting the thin file into solution, and generating a calibration curve using standard solutions of certified concentration. ICP emission spectrometry, which allows simultaneous analysis at multiple wavelengths, is an effective method for analyzing this sample placed in solution. Here we introduce an example of analysis of the Mo rear electrode layer and CIGS layer of thin film on a glass substrate using the Shimadzu ICPE-9000 Multitype ICP Emission Spectrometer.

December 2, 2010 GMT