Approaches to Nanoparticles by SPM Observation and Size Distribution Analysis of Nanoparticles with Mixed Sizes

Scanning Probe Microscope SPM / Atomic Force Microscope AFM

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Introduction

Nanoparticles are used in diverse fields, including magnetic data memory, photocatalysts, biosensing, and drug delivery systems (DDS). Because the shape, size, and other features of nanoparticles govern their product performance, strict quality control is necessary. For example, in case nanoparticles are to be used as an abrasive when manufacturing silicon wafers or other semiconductor substrates for microchips, uniform particle size is essential, and in applications such as biosensing which utilize the optical characteristics of nanoparticles, not only the size but also the shape of the nanoparticles is important. The scanning probe microscope (SPM) is a type of microscope which is capable of observing the 3-dimensional topography and local physical properties of samples by scanning the sample surface with a minute probe (cantilever). Boasting nanometer order resolution, SPM enables detailed observation of the shapes of nanoparticles and measurement of particle diameter. Moreover, because conductivity is not required in samples, it is also possible to analyze nanoparticles of various materials, including silica, metals, polymers, and biomaterials, without selecting the atmosphere for observation and measurement. This article introduces an example of shape observation and analysis of the particle size distribution of nanoparticles by SPM.

September 1, 2020 GMT

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