8K High Pixel Resolution Observation Leading You into the Nano World ! Simultaneously Achieves Both Large-Area Observation and High Definition Analysis

User Benefits

�- Simultaneous large-area observation and high definition analysis are possible by 8K high pixel resolution observation. � - Minute differences in roughness can be captured by surface roughness analysis utilizing high definition images.

Introduction

The scanning probe microscope (SPM (AFM)) is widely used in the fields of nanoparticles and soft materials as a tool that enables simple and nano-level high resolution observation in the ordinary atmosphere. In recent years, new materials which have both macro- and micro-scale structures have appeared, and simultaneous structural observation of both is demanded. However, in large-area observation by conventional SPM, high definition analysis was difficult when images were enlarged due to the limited pixel count of the existing technology. This article introduces an example in which both large-area observation and high definition analysis were achieved simultaneously by using the SPM-Nanoa, a new Shimadzu SPM that realizes 8K high pixel resolution observation.

April 1, 2021 GMT