Relative Specular Reflectance Measurement
With relative specular reflectance measurement, the reflectance is calculated from the strength ratio after comparing the light reflected from the reference sample with the light reflected from the measurement sample. As shown in the figure, the reflectance of the reference sample is taken to be 100%, and the reflectance of the sample with respect to this reference sample is measured. This method is often applied to the examination of semiconductors, optical materials and multi-layer films.
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Shimadzu has released the AIRsight, Infrared/Raman Microscope
Raman and FTIR microscopy in perfect harmony. Infrared and Raman Microscope based on a combination of two analytical techniques to provide complementary molecular information. The AIRsight system improves the efﬁciency of analytical operations by making it easy to perform all process steps from sample observation to data analysis.
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UV TALK LETTER Vol. 22 is now available.
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