Xslicer SMX-1010/1020 - Features

Microfocus X-Ray Inspection System

High Image Quality Exceeding the Level of General-Purpose Models

 Equipped with ultra-high-resolution 3 megapixel flat panel detector*

*Xslicer SMX-1020

The Xslicer SMX-1020 is equipped with a 3 megapixel flat panel detector. Users can assess internal structures or defects in detail
while observing a wide field of view.
The Xslicer SMX-1020 can inspect sizes with twice the field of view as the SMX-1010.

  • Equipped with ultra-high-resolution 3 megapixel flat panel detector
  • Equipped with ultra-high-resolution 3 megapixel flat panel detector
Equipped with ultra-high-resolution 3 megapixel flat panel detector

 New HDR Processing Function

Shimadzu's unique, proprietary image processing technique/algorithm allows fluoroscopic images with a higher dynamic range. Regions that are both easy and difficult to penetrate can be observed at the same time, which shortens inspection times.

New HDR Processing Function

Software Significantly Shortens Inspection Times

 Inspections Start in 3 Steps and 5 Seconds

Just a 3-step process before starting observations. After the start button is clicked, X-ray emission and exterior camera imaging are
automatic. X-ray fluoroscopic imaging can start 5 seconds after sample placement (4.6 times faster than the previous model).

Inspections Start in 3 Steps and 5 Seconds

Simple Operation

 Simple UI and Easy Positioning Operations

A large monitor screen and simple button layout provide excellent visibility for intuitive operability. X-ray inspections can be performed easily, even by operators using the system for the first time.

Simple UI and Easy Positioning Operations

 Faster Detector Acquisition and Stage Movements

The flat panel detector acquisition is 4× faster than the previous model, and the stage movement (XY direction) is 1.6× faster. In addition to ordinary use, this contributes to faster tact times during consecutive inspections.

Faster Detector Acquisition and Stage Movements

 Example of Continuous Inspections Using the Step Feed Function

Inspection times were compared for consecutive X-ray inspections of 25 samples using the step feed function on the previous SMX-1000 Plus and the SMX-1020. Inspection times are approximately 40 % shorter in comparison to the SMX-1000 Plus.
Additionally, X-ray emission times are reduced by at least 35 %, which also reduces running costs. The time reduction ratio increases as the number of samples increases.

Example of Continuous Inspections Using the Step Feed Function
Example of Continuous Inspections Using the Step Feed Function

Samples arranged at fixed intervals can be observed consecutively. The starting position, movement amount, and number of movements can be specified. During implementation, consecutive movements and observations are made in accordance with the settings from the start position. After the inspection, a table of the pass/ fail/hold results can be displayed.

 

 Inspections with the Xslicer SMX-1020 Take Half the Time of the Xslicer SMX-1010

The Xslicer SMX-1020 can inspect twice the horizontal area of the SMX-1010. The area in a single inspection is twice the size, so the inspection takes about 1/2 the time. The time can be shortened even more in consecutive inspections of samples arranged on a pallet.

Inspections with the Xslicer SMX-1020 Take Half the Time of the Xslicer SMX-1010

Diverse Functions Provide 3D Analysis with a Single Unit

 Simple CT Function with High Image Quality (Optionally Available)

Simply position the compact CT unit on the fluoroscopic stage and switch the software tab to enable 3D analyses unobservable with fluoroscopic functions. There is no need to switch software programs, so CT imaging can start easily.

  • Simple CT Function with High Image Quality (Optionally Available)
  • Simple CT Function with High Image Quality (Optionally Available)

 Automated Calibration (Shorten the time for process before imaging by 80 %)

Calibration has been automated, simplifying CT imaging. There is no need for calibration each time a sample is loaded as previously. Imaging is started simply by selecting either [Simple], [Normal], or [Fine].

  • Automated Calibration (Shorten the time for process before imaging by 80 %)
  • Automated Calibration (Shorten the time for process before imaging by 80 %)

 Panoramic Imaging Function

A wide X-ray fluoroscopic image can be obtained just by specifying the imaging range on the exterior image. An improved stitching process ensures a panoramic X-ray fluoroscopic image up to 32 megapixels in size can be obtained with no conspicuous marks where the images are spliced together.

Panoramic Imaging Function

 

Imaging Mode Pixels 300 × 350 mm
Scanning time for entire range
Simple Equivalent to 2K (full HD) in size Approx. 2 million pixels SMX-1010 : 115 sec / SMX-1020 : 100 sec
Normal Equivalent to 4K in size Approx. 8 million pixels SMX-1010 : 135 sec* / SMX-1020 : 120 sec
Fine Equivalent to 8K in size Approx. 32 million pixels SMX-1010 : 590 sec / SMX-1020 : 495 sec

*The SMX-1000 Plus takes 395 seconds at the fastest.

 Image Adjustment Functions
(Auto Window Function and Area of Interest Function)

The contrast can be automatically optimized to make the area of interest easy to see.

  • Image Adjustment Functions (Auto Window Function and Area of Interest Function)
  • Image Adjustment Functions (Auto Window Function and Area of Interest Function)

Image Measurement Functions

 Ball Grid Array (BGA) Measurements

BGA bump diameters and void ratios can be measured.
With our proprietar y image proces sing algorithm, compl icated parameter set tings are unnecessary.*
Multiple settings can be saved and applicable ones can be accessed for each inspection target prior to measurement.
* Manual adjustments may be required depending on the sample.

Ball Grid Array (BGA) Measurements

 Area Ratio Measurements

Area Ratio Measurements

Die bonds, solder paste wettability, and other area ratios can be measured.
The parameter settings are not required thanks to Shimadzu's proprietary image processing algorithm.*
It is also possible to save multiple settings, and then call up the applicable settings for each inspection target prior to measurement. Furthermore, pass/fail determinations can be made based on the area ratio.
* Manual adjustments may be required depending on the sample.
* The measurement range (ROI) can be configured manually.

Area Ratio Measurements

 Wire Sweep Ratio Measurements

Wire Sweep Ratio Measurements

The wire sweep ratio can be measured by specifying both ends of the bonding wire and the point of maximum curvature.
Pass/fail determinations can be made depending on the wire sweep ratio.

Wire Sweep Ratio Measurements

 Dimension Measurements

The Xslicer SMX-1010/1020 supports both 2-point distance and 3-point measurements.
With this system, sizes are measured efficiently by calculating calibration data internally in synchronization with the fluoroscopic magnification.

Dimension Measurements

A Wealth of Functions for Facilitating Inspections

 Teaching Function

Fluoroscopic and CT imaging can be automated using the Teaching Function, which moves the sample stage to preregistered points of interest.
Additionally, for visual inspection, OK and NG judgment functions are included.

  • Teaching Function
  • Teaching Function

 Shortened Source-Detector Distance (SDD) Function

The distance from the X-ray generator to the X-ray detector (SDD) can be switched to 185 mm (The standard distance is 370 mm) By shortening the SDD, images with sufficient penetration can be obtained even for samples that are hard to penetrate.

Shortened Source-Detector Distance (SDD) Function

 Inclined Fluoroscopy Function

The flat panel detector can be tilted up to 60 degrees. Since the detector tilts, the sample does not need to be fixed. Inclined fluoroscopy ensures that the specified sites are particularly easy to see.

  • Inclined Fluoroscopy Function

    Detector not tilted

  • Inclined Fluoroscopy Function

    Detector tilted 60 degrees

 Set Tracking Points Easily

If a tracking point is set, the observation position of interest when tilted and rotated never leaves the center of the window.
As a result, the point of interest is never lost.
To set a tracking point, simply tilt the detector and double click the position of interest.

Set Tracking Points Easily

Downloads

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