AXIS Supra+ - Specs
Imaging X-Ray Photoelectron Spectrometer
|X-ray photoelectron spectroscopy (XPS)||
Spectroscopic performance is defined as counts per second for a FWHM measured for the Ag 3d5/2 component.
|XPS parallel imaging||
Ultimate spatial resolution of parallel imaging mode is 1 um.
|Performance on insulators||
The AXIS Supra+ has an electron only charge neutralisation system. Performance of the charge neutraliser system is confirmed on the standard polymer, polyethylene terephthalate (PET).
5-axis, motorised precision manipulator integrated with fully automated sample exchange for up to 3 sample holders.
Minibeam 4 monatomic Ar+ ion source or Minibeam 6 multi-mode Gas Cluster Ion Source (GCIS) for sample cleaning and sputter depth profiling.
Kratos Analytical has a policy of continuous product improvement and therefore reserves the right to make alterations to specifications without notice. Please contact us to request the latest AXIS Supra+ specification sheet.