Introduction of Variable Angle Absolute Reflectance Attachment for the SolidSpec-3700

Introduction

The variable angle absolute reflectance attachment is an attachment that allows absolute reflectance measurement with an angle of incidence selectable within the range of 5 ̊ to 70 ̊. Using a system in which a goniometer rotates the sample holder and detector (integrating sphere) on the same axis, the angle of incidence of light irradiated on the sample can be freely changed. Moreover, utilization of an integrating sphere when performing transmittance measurement allows variable-angle transmittance measurement and measurement of the scattered light angle distribution of transmitted light. This attachment can be installed in the highly-acclaimed SolidSpec-3700 UV-VIS-NIR spectrophotometer for measurements in the electrical and semiconductor fields. This Application News introduces an example of measurement of functional multilayer film used in solid-state lasers.

January 23, 2007 GMT