Measurement of Film Thickness Using LabSolutions™ UV-Vis: Film Thickness Calculation by Interference Interval Method

Spectrophotometric Analysis

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Introduction

Various measurement methods and instruments are available for film thickness measurements. However, simple, noncontact, nondestructive measurement is possible by using an ultravioletvisible (UV-Vis) spectrophotometer. This article introduces the possible range of film thickness measurements in the ultravioletvisible light wavelength region was investigated using an UV-Vis spectrophotometer.

March 25, 2020 GMT