High-Speed Mapping Measurement of Micro Sample Using IRXross™/AIM-9000

User Benefits

- High-speed measurement is possible by using the IRXross FTIR and AIM-9000 infrared microscope. - High-speed mapping measurement is also possible by using this system in combination with optional mapping software. - Measurement throughput is greatly enhanced by shortening the measurement time.

Introduction

The IRXross Fourier transform infrared spectrophotometer (FTIR) released recently by Shimadzu Corporation offers the highest class sensitivity and resolution and can support high-speed scanning at a maximum of 20 spectra/second. Shimadzu original software IR Pilot^TM for navigation of analysis work is also provided as a standard feature, realizing excellent operability together with outstanding performance. Among these features, this article introduces an example of a micro sample mapping analysis, focusing on high-speed measurement using the IRXross in combination with an AIM- 9000 infrared microscope. The IRXross uses the same stable moving mirror system as the IRTracer^TM-100 to realize high-speed measurement. In particular, measurement time can be substantially shortened by using this instrument in combination with the AIM-9000 infrared microscope equipped with a high-response speed MCT detector.

April 5, 2022 GMT