Analysis of Fluorine by EDXRF—A Simple Check for PFAS in Electrical and Electronic Components

User Benefits

- EDXRF analyzes halogens (F, Cl, Br, and I) more easily than absorption/emission methods. - Fluorine (F) on the material surface is detected directly, without sample preparation. - Simultaneous halogen analysis enables simple screening for the possible use of halogenated flame retardants.

Introduction

As regulations on PFAS and halogenated organic flame retardants tighten in the EU and some U.S. states, there is a growing need to identify at an early stage whether halogens such as fluorine are present in electrical and electronic materials. Rapid supply-chain screening is also increasingly required. The energy dispersive X-ray fluorescence spectrometer EDX-8100 requires little to no sample preparation and can quickly and easily detect halogens such as fluorine (F), chlorine (Cl), and bromine (Br). EDX-8100 quickly shows whether these halogens are present, helping narrow down regulated products and prioritize samples for detailed analysis. This article demonstrates the usefulness of halogen detection by EDXRF using an ETFE-coated wire and a relay as examples.

August 24, 2026 GMT