New Solutions for Solid Sample Measurement!The Introduction of SolidSpec-3700/3700DUVThe World First 3-Detector System realizesThe High Sensitivity Measurements in Entire NIR Region

Introduction

The new SolidSpec-3700/3700DUV UV-Vis-NIR Spectrophotometer has been placed on the market to demonstrate its power in the fields of optics and semiconductors. The SolidSpec-3700 is the standard model, while the SolidSpec-3700DUV is specified for analysis in the deep UV (DUV) region. These new products, equipped with various features, including the extra large sample compartment provided as standard and support a wide range of applications. The SolidSpec-3700/3700DUV incorporates three detectors – photomultiplier tube, cooled PbS detector and InGaAs detector. The InGaAs and cooled PbS detectors are used for the NIR (near infrared) region to achieve high sensitivity over the entire NIR region. In addition, the SolidSpec-3700DUV allows measurement in the DUV region (165 – 190nm)that was difficult with conventional spectrophotometers, enabling evaluation of semiconductor parts in the DUV region, which is necessary in the semiconductor field. Introduced here are examples of reflectance and transmittance measurements with particular focus on the sensitivity improvement due to the three-detector system.

January 20, 2005 GMT