EDX-7000/8000/8100 - Options

Energy Dispersive X-ray Fluorescence Spectrometer

Screening Analysis Kits

Ideal for RoHS, ELV, and Halogen Screening

The optional screening analysis kits allow even beginners to start RoHS, halogen, or antimony screening analysis right from the day of purchase. Simply mount the sample, select the analysis conditions, enter the sample name, and wait for the results. The analysis results are displayed with a pass/fail evaluation after just a few minutes.

Analytical results window using the RoHS, Halogen and Antimony screening kit

Internal Calibration Curves and Automatic Calibration Curve Selection

Internal calibration curves
Internal calibration curves are provided for many materials, making it unnecessary to provide a large number of standard samples.

Automatic calibration curve selection
The software automatically selects the best calibration curve for the material, freeing the user from the need to select analysis conditions.
As an incorrect calibration curve selection can result in large error in the quantitation results, this function contributes to improved data reliability.

Shape correction
The fluorescent X-ray and scattered X-ray intensities are compared for each element (BG internal standard method) to eliminate the effects of the sample shape and thickness in the quantitation values.

Automatic Measurement Time Reduction

This function automatically switches to the next analysis channel if a controlled substance clearly has a high or low concentration, making evaluation possible while measurement is underway. This achieves more efficient screening analysis.

Screening Simple Setup Screen

Simple Setup Screen of RoHS Screening Analysis Kit

Threshold Values
A threshold value can be set for each material and element. The screening evaluation method changes according to how the threshold values are set.

Evaluation Character String
Character strings can be set for display in the analysis results when the threshold value is not exceeded, in the gray zone, and when the threshold value is exceeded.

Report Template
Set the report style from among the templates supplied as standard.

Three screening Analysis kits are available to suit dif ferent applications.

RoHS Screening Analysis Kit
Kit for screening cadmium, lead, mercury, chromium, and bromine. Polyethylene samples containing these five elements are supplied in the kit for instrument management.

RoHS and Halogen Screening Analysis Kit
In addition to cadmium, lead, mercury, chromium, and bromine, this kit also supports the screening of chlorine in plastics. Polyethylene samples containing these six elements are supplied in the kit for instrument management.

RoHS, Halogen, and Antimony Screening Analysis Kit
In addition to cadmium, lead, mercury, chromium, and bromine, this kit also supports the screening of chlorine and antimony in plastics. Polyethylene samples containing these seven elements are supplied in the kit for instrument management.

EDX-7000/8000/8100 Options

EDX-FTIR Contaminant Finder/Material Inspector EDXIR-Analysis software

By measuring the sample with both EDX and FTIR systems and using EDXIR-Analysis to analyze both EDX and FTIR data, elements can be identified automatically with high accuracy.

 

Small Spot Analysis Kit

This kit is especially useful for analyzing trace foreign matters and micro areas.
This combination includes a 0.3 mm diameter collimator and high resolution camera.

Pharmaceuticals Impurities Analysis Method Package for EDX-7000

This package can be used to control g/g-level concentrations of 12 of the 24 elemental impurities specified in ICH Q3D Guideline for Elemental Impurities, including Class 1 elements Cd, Pb, As, and Hg, Class 2A elements V, Co, and Ni, and Class 2B elements Ir, Pt, Ru, Rh, and Pd.
(Option for EDX-7000)

Sample Holder/Stocker for Contaminant Measurement EDXIR-Holder

Measure the Samples Kept in the Holder with EDX and FTIR
The Holder Can Be Used as the Sample Stocker after the Measurement

 

■ Vacuum Measurement Unit

Use this unit for sensitive measurements of light elements. It requires space for installation of a rotary pump and switch box at the side or rear of the desk supporting the main unit.

 

■ Helium Purge Unit

This unit is used for highly sensitive measurements of light elements in liquid samples. Does not include a helium cylinder or regulator.
(Option for EDX-7000)

 

■ Turret Unit

Turret for 12 samples. It permits continuous measurements of samples up to 32 mm in diameter. It improves throughput, especially for measurements in a vacuum or helium atmosphere.

 

■ Screening Analysis Kits

RoHS/ELV Screening Analysis Kit
- With check samples for five elements
RoHS and Halogen Screening Analysis Kit
- With check samples for six elements
RoHS, Halogen, and Antimony Screening Analysis Kit
- With check samples for seven elements

 

■ Polyester Film

Sample-holding film (for heavy element analysis)

 

■ Polypropylene Film

Sample-holding film (for light element analysis)

■ Sample Cells
 

3571 General Open-End X-Cell
(no lid)


(Outer diameter: 31.6 mm, volume: 10 mL)
Polyethylene sample cell for liquid and powder samples.

3529 General X-Cell (with lid)

(Outer diameter: 32 mm, volume: 8 mL)
For liquid samples. Equipped with a relief hole and liquid retainer in case of liquid expansion.

3577 Micro X-Cell

(Outer diameter: 31.6 mm, volume: 0.5 mL)
For trace samples. Recommended for use with a collimator.

3561 Universal X-Cell

(Outer diameter: 31.6 mm, volume: 8 mL)
For liquid and thin-film samples. Equipped with a relief hole and liquid retainer in case of liquid expansion. Equipped with a ring to tightly hold thin-film samples with film.

Small Spot Analysis Kit for EDX-7000/8000


For Analysis of Small Contaminants and Defect Analysis in Small Regions

Minimum 0.3 mm X-Ray Irradiation Diameter Effective for the Analysis of Small Contaminants and Small Regions

Features

  • Minimum 0.3 mm X-Ray Irradiation Diameter
    The excitation X-rays can be collimated to 0.3 mm in diameter, which is effective for the high-accuracy analysis of small contaminants and for defect analysis in small regions, analyses difficult with standard specifications (minimum 1 mm in diameter).

  • Enlarged Sample Images without Image Quality Degradation
    This system supports smaller samples, which heightens the visibility of sample observation images. Users can switch to an enlarged image approximately 2.5 times larger than a previous image, without image quality degradation.

  • Automatic Four-Stage Switching Between 0.3, 1, 3, and 10 mm in Diameter
    The irradiation diameter automatically switches between 0.3, 1, 3, and 10 mm in diameter. This system supports not only the analysis of small spots but also macro composition analysis at 10 mm in diameter.

Note: The irradiation diameter is the size on the sample surface.

Analysis Example

Small Metal Powder (Approx. 0.1 mm in Diameter) Adhered to the Surface of Snacks

A small metal powder approximately 0.1 mm in diameter adhered to the commercially available snacks was analyzed with irradiation diameters of 1 mm and 0.3 mm respectively. At an irradiation diameter of 1 mm, the overall background is significantly increased due to the influence of scattered X-rays from the surrounding area of the metal powder (snacks), resulting in a poor S/N ratio. At an irradiation diameter of 0.3 mm however, the influence of scattered X-rays from the surrounding area is small, and peak profiles with a good S/N ratio are obtained.Copper (Cu) and Zinc (Zn) are detected as the major component with both irradiation diameters. It indicates that the metal powder is brass regardless of the irradiation diameter used. However, at 0.3 mm in diameter, the peak of Lead (Pb) is also identified, which suggests that the metal powder is not only the brass, but the "free cutting brass" contains Lead.
By using an irradiation diameter of 0.3 mm, more accurate analyses can be performed, even for small contaminants on substance such as organic materials that strongly scatter X-rays.

Also Capable of Film Thickness Measurements for Small Spots of Plating

When film thickness measurements are performed with the calibration curve method or the thin-film FP method, the sample (measurement position) must be larger than the X-ray irradiation diameter. This system supports film thickness measurements for small spots of plating, which were difficult at an irradiation diameter of 1 mm.

EDX-FTIR Contaminant Finder/Material Inspector EDXIR-Analysis

Provides Strong Support for Contaminant Identification Analysis

High-accuracy identification analysis can be performed automatically by measuring one sample with EDX and FTIR, and then analyzing both data sets with EDXIR-Analysis.




For more details, visit
EDXIR-Analysis