SPM-8100FM - Specs

High-Resolution Scanning Probe Microscope

Observation mode

Contact, dynamic (AM method and FM method), lateral force (LFM)


Horizontal: 0.2 nm; Vertical: 0.01 nm

SPM head

Displacement detection system: Light source, optical lever, detector Light source: Laser diode (ON/OFF) Irradiates a cantilever continuously even while replacing samples Detector: Photodetector


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