SPM-8100FM - Specs
High-Resolution Scanning Probe Microscope
Contact, dynamic (AM method and FM method), lateral force (LFM)
Horizontal: 0.2 nm; Vertical: 0.01 nm
Displacement detection system: Light source, optical lever, detector Light source: Laser diode (ON/OFF) Irradiates a cantilever continuously even while replacing samples Detector: Photodetector
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