High Resolution Scanning Probe Microscope
- Uses the FM-AFM method
- Noise in air and liquids is reduced to 1/20th that of existing methods.
- Achieves the performance level of a vacuum-type SPM, even in air and liquids!
- The installation of the HT scanner has expanded the observation area and increased speed.
- Dual monitors and signal capabilities greater flexibility
Observations were made of the arrangement of atoms on a NaCl surface in a saturated aqueous solution. Atoms hidden by noise in existing AFM observations (AM method, left) are clearly visible when the FM method (right) is used. The FM method provides true atomic resolution.
Pt catalyst particles in a TiO2 substrate were identified, and the surface potential was measured using a KPFM. Pt particles several nm in size were observed in the exchange of charges with the substrate. In the figure on the right, the red circles indicate positive potential, and the blue circles indicate negative potential. It is evident that the resolution has been dramatically improved, even for a KPFM.
Note: KPFM functionality is available on a special order basis.