Electronic Component - Related Information

Py-Screener Ver. 3: Simultaneously Test for Substances Regulated Under RoHS, TSCA, and POPs [ PDF / 502.38KB ]

Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature [ PDF / 652.07KB ]

Measurement of Elemental Distribution of Multi-Layer Ceramic Capacitor [ PDF / 1.04MB ]

Residual NMP and solvent analysis in lithium-ion battery cathode materials [ PDF / 524.71KB ]

Evaluation of Oil Residues on Aluminum Foil Surfaces [ PDF / 606.96KB ]

Observation of Wireless Earphones Using a Microfocus X-ray Inspection System [ PDF / 1.1MB ]

Micro-Contaminant Analysis Using AIMsight Infrared Microscope [ PDF / 349.42KB ]

Analysis of Organic EL Materials and Impurities Using Single Quadrupole Mass Spectrometer [ PDF / 378.54KB ]

Cross-Sectional Mapping Analysis of Contactless Type IC Cards [ PDF / 843.11KB ]

Observation of Crimped Terminals Using X-Ray CT System [ PDF / 1.16MB ]

High-Speed Mapping Measurement of Micro Sample Using IRXross™/AIM-9000 [ PDF / 268.68KB ]

Example of Observing Printed Circuit Board in 5G Smartphone Using a Microfocus X-Ray CT System [ PDF / 1.85MB ]

Purification of Organic Light-Emitting Diode Materials [ PDF / 182.96KB ]

Analysis of Printed Circuit Boards for 5G Communication Equipment [ PDF / 1.15MB ]

Cross-Sectional Mapping Analysis of IC Cards [ PDF / 770.31KB ]

Visualization of Current Distribution by ZXY Measurement: Current Measurement of Graphite Sample [ PDF / 477.45KB ]

8K High Pixel Resolution Observation Leading You into the Nano World ! Simultaneously Achieves Both Large-Area Observation and High Definition Analysis-2 [ PDF / 1.31MB ]

Analysis of MEA (Membrane Electrode Assembly) [ PDF / 3.4MB ]

Visualization of Distribution of Electrostatic Force in Electrolyte Clarifying Corrosion and Cell Reactions [ PDF / 359.84KB ]

Analysis of Positive Electrode (NCM) for Lithium Ion Battery by EPMA and SPM [ PDF / 1.37MB ]

Example of Analysis of Solder Filling Using inspeXio™ SMX™-225CT FPD HR Plus X-Ray CT System [ PDF / 1.01MB ]

Example of Observation of Crystal Oscillators with inspeXio™ SMX™-225CT FPD HR Plus [ PDF / 1.7MB ]

Analysis of Micro Ag Particles of Lead-Free Solder - Electron Probe Microanalyzer [ PDF / 2.15MB ]

Analysis of Lead-Free Solder Joint Interface [ PDF / 1.49MB ]

Example of Observation of Power Inductors Using inspeXio™ SMX™-225CT FPD HR Plus X-ray CT System [ PDF / 2.15MB ]

An Example Observation of a Large Mounted Circuit Board Using Xslicer SMX-6000 - Microfocus X-Ray Inspection System [ PDF / 2.39MB ]

A Soldering Defect Inspection Using the Automatic Measurement System of SMX-1000 Plus [ PDF / 1.25MB ]

Imaging with the AIM-9000 Infrared Microscope - Spectrophotometric Analysis [ PDF / 654.98KB ]

Optical Properties of Films and Glasses Used to Protect Smartphones - Spectrophotometric Analysis [ PDF / 298.06KB ]

Printed Circuit Board Defect Analysis - Spectrophotometric Analysis [ PDF / 701.47KB ]

Fluorescence Measurement of Organic Electroluminescent Material - Spectrophotometric Analysis [ PDF / 95.74KB ]

Measurement of Emission Spectra of LED Light Bulbs [ PDF / 3.14MB ]

Measuring the Fluorescence Quantum Efficiency of Liquid Samples [ PDF / 2.02MB ]

Transmittance Measurement of Smartphone Proximity Sensor Window - Spectrophotometric Analysis [ PDF / 2.06MB ]

Emission Spectrum Measurement for LED Lamp by the UV-2600 UV-VIS Spectrophotometer - Spectrophotometric Analysis [ PDF / 1019.85KB ]

EDXRF Analysis of Lead, Cadmium, Silver, Copper in Lead-Free Solder Materials [ PDF / 711.14KB ]

Internal Observation of Button-Shaped Batteries and LED Lights [ PDF / 954.23KB ]

Continuous Visualization of Process of Positive Streamer Initiation, Propagation, Spark, and Bubble Expansion in Water [ PDF / 2.05MB ]