Kratos AXIS Nova - Specs
Imaging X-Ray Photoelectron Spectrometer
Specifications
| X-ray photoelectron spectroscopy (XPS) |
Spectroscopic performance is defined as counts per second for a FWHM measured for the Ag 3d5/2 component. |
|---|---|
| XPS parallel imaging |
Ultimate spatial resolution of parallel imaging mode is < 3 um. |
| Performance on insulators |
The AXIS Nova has an electron only charge neutralisation system. Performance of the charge neutraliser system is confirmed on the standard polymer, polyethylene terephthalate (PET). |
| Sample handling |
Up to three large, 110 mm diameter sample platens can be introduced to the AXIS Nova at a time. Sample handling is fully automated. |
| Ion source |
Minibeam 4 monatomic Ar+ ion source or Minibeam 6 multi-mode Gas Cluster Ion Source (GCIS) for sample cleaning and sputter depth profiling. |
Kratos Analytical has a policy of continuous product improvement and therefore reserves the right to make alterations to specifications without notice. Please contact us to request the latest AXIS Nova specification sheet.
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