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Kratos AXIS Nova - Downloads

Imaging X-Ray Photoelectron Spectrometer

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Analysis of drug coated polymer stents studied by XPS Keywords bioresorbable polymer, biomedical material, GCIS depth profile Introduction Cardiovascular interventional therapy with stents has emerged as the most effective method for coronary heart ...

1 de dic. de 2020

Applications Note Group Array Analysis of a Combinatorial Thin Film System MO455(A) Keywords group array analysis, ESCApe, thin film materials Overview The last few decades have seen rapid development in computational and theoretical tools for f ...

1 de dic. de 2020

Overview Thin polymer films are found in an enormous range of devices and have many applications from use in semi-conductors, displays and solar cells to corrosion protection and packaging. New ion sources such as the multi-mode Ar gas cluster ion so ...

1 de dic. de 2020

Combined Argon cluster UPS-XPS depth profile of OLED thin-film Keywords XPS, UPS, GCIS, Argon cluster, OLED, TCTA Overview Low-energy argon cluster ions were used to depth profile through an organo-electronic (TCTA) thin-film deposited on ITO. XPS a ...

25 de nov. de 2020

Quantification of layer composition in compound semiconductors Keywords GCIS depth profile, vertical cavity surface emitting laser (VCSEL), single photon LED (SPLED) Introduction Compound semiconductors are the key underpinning technology in optoelec ...

25 de nov. de 2020

Superior performance, high throughput imaging X-ray photoelectron spectrometer MO444(A) AUTOMATED PLATEN EXCHANGE Automated multi-platen exchange allows transfer between the sample storage elevator in the SEC and SAC analysis position without User i ...

1 de dic. de 2020

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