An Example Observation of a Smartphone Using Xslicer SMX-6000

Introduction

As with tablets, smartphones are widely used mobile devices. In these electronic devices, various electronic components are mounted effectively in a limited amount of space in order to achieve high mobility and high performance concurrently. Along with the evolution of such devices, their internal structure is becoming increasingly complex. Meanwhile, the manufacturing of electronic components involves a certain rate of defect. Defective components not only interrupt the operation of devices but also can cause accidents including fire and explosion. Accordingly, defect inspections of products are extremely important to achieve safe and reliable electronic devices. One of the methods for such inspections is the internal observation of a device using an X-ray inspection system. X-ray inspections are advantageous because they enable non- destructive internal observation meaning that products can be inspected in the same state as that they are placed on the market. This article introduces an example observation of a smartphone using the Xslicer SMX-6000 microfocus X-ray inspection system.

May 9, 2018 GMT