IRTracer-100
Spectrophotometric Analysis
Contaminants and stains on printed circuit boards can cause conduction defects. Identifying these materials is an important part of preventing the same problem occurring again. We describe a qualitative analysis of contaminants found on a printed circuit board performed using the AIM-9000 Infrared Microscope, which is specially designed for defect analysis.
November 7, 2016 GMT
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