Measuring Micro-Contaminants on Optical Parts: Measurement and Identification by AIM-9000 Infrared Microscope

Introduction

Due to the miniaturization and increasingly sophisticated functionality of electrical and electronic devices, an increasing number of optical devices are being used today, such as ultra-small and high-performance semiconductor devices and sensors. However, in such miniaturized devices, micron-sized tiny contaminants can cause the devices to malfunction. Therefore, manufacturers need to determine what caused such contaminants to enter the devices, so their recurrence can be prevented. Shimadzu AIM-9000 infrared microscope features optics that are designed especially for measuring microscopic areas, and allows users to obtain good spectra in short time even for micron-sized tiny contaminants. The following describes an example of using this system to measure micro-contaminants about 10 μm in diameter on the surface of an optical part.

November 24, 2016 GMT