The selected ion monitoring (SIM) method is capable of high-sensitivity measurements, so it is utilized for the analysis of trace components, such as residual pesticides in foods. With existing SIM conditions settings, however, the number of components is limited to a few hundred, and configuring the settings is difficult. In addition, when many ions are monitored simultaneously, the sensitivity is reduced. Smart SIM was developed to solve these problems.
This article provides an example of its application to the simultaneous analysis of 418 pesticides.