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Relative Specular Reflectance Measurement
With relative specular reflectance measurement, the reflectance is calculated from the strength ratio after comparing the light reflected from the reference sample with the light reflected from the measurement sample. As shown in the figure, the reflectance of the reference sample is taken to be 100%, and the reflectance of the sample with respect to this reference sample is measured. This method is often applied to the examination of semiconductors, optical materials and multi-layer films.
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News / Events
Release of Six New UV-i Selection Brand UV-VIS Spectrophotometer Models
The SolidSpec-3700i/3700i DUV have three detectors which cover the range from ultraviolet to near-infrared. This product is equipped with LabSolutions UV-Vis software.
Shimadzu has released the UV-1900i UV-VIS Spectrophotometer.
The UV-1900i is a double-beam UV-Vis Spectrophotometer using Shimadzu's original LO-RAY-LIGH™ diffraction grating technology.
This product is equipped with LabSolutions UV-Vis software.
FTIR TALK LETTER Vol. 33 is now available.
FTIR TALK LETTER Vol. 32 is now available.
By combining proven LabSolutions IR software and AIMsolution software for controlling the infrared microscope, a highly reliable regulatory compliant software system was created.