FLM-UVPC Film Thickness Measurement Software
This software calculates film thickness from the peak positions of the interference pattern caused by the film. Film thickness is calculated by the method of least square using the wavelengths of the all peaks and valleys within a specified wavelength range. For UV-2600 series/2700 series/3600/3600Plus series, SolidSpec series PC software (compatible OS:Windows 10 (64bit) / Windows 7 (64/32bit))
News / Events
Shimadzu has released the IRXross
The IRXross™ creates a new concept for infrared spectroscopy. It offers the optimal solution for a new era with diverse application requirements.
UV TALK LETTER Vol. 22 is now available.
Shimadzu has released the Guide to Biopharmaceutical Solutions
FTIR TALK LETTER Vol. 36 is now available.
Analysis of Biodegradable Plastics
UV-Vis-NIR Spectroscopy Software VisEase