EPMA-8050G

Debut of the Grand EPMA With a Cutting-Edge FE Electron Optical System, the Ultimate in Advanced Shimadzu EPMA Analysis Performance

This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.

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