EPMA-8050G

Electron Probe Microanalyzer

Debut of the Grand EPMA

With a Cutting-Edge FE Electron
Optical System,
the Ultimate in Advanced
Shimadzu EPMA Analysis Performance


This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
It is certainly appropriate to call this the grand EPMA, the debut of the ultimate EMPA system.

Features

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For Research Use Only. Not for use in diagnostic procedures.

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