High-Wavelength Resolution and Instantaneous Spectrometric Measurement at Wavelengths from 185 to 1095 nm
The SPG-V500 is an optical spectrum analyzer that measures spectra at multiple wavelengths simultaneously and in real time. With multimode fiber input, it reduces optical alignment effort and helps streamline laser measurements in the 185–1095 nm range.
Features
- Assess Spectral Behavior in the Blink of an Eye Using Simultaneous Multi-Wavelength Measurements
Using an array sensor, it simultaneously acquires spectra at multiple wavelengths. Spectra can be acquired at intervals as short as the minimum integration time of 6 μs, enabling detection of spectral behavior such as mode hopping. It also supports pulsed laser measurement.
- Save time with easy setup, high resolution, and high-speed measurement
With multimode fiber*1 input, wavelength resolution is approximately 20 pm (Typ.). Precise optical alignment is not required, and subtle peak changes can be detected simply by directing the optical fiber toward the measurement target*2. In addition, because multiple wavelengths are measured simultaneously, measurement time is reduced. This shortens the total time from setup to measurement.
- Wide measurement range covering ultraviolet (UV), visible (VIS), and near-infrared (NIR)
A single unit covers the 185–1095 nm wavelength range, enabling measurement of both the fundamental wavelength and wavelength-converted output for deep-ultraviolet lasers at 266 nm*3.
- *1: The recommended core diameter is 200 to 600 µm. Spatial incidence is also possible.
- *2: Even higher wavelength resolution measurements can be obtained by utilizing higher order light.
- *3: When measuring the fundamental wave, use an order separation filter to remove higher harmonics.
See the features of the SPG-V500 series ＞
Typical Applications
The SPG-V500 combines high-resolution, real-time measurement with multimode fiber input. In addition to reducing measurement time, it visualizes longitudinal mode behavior such as mode hopping. This helps accelerate the development of laser light sources and laser modules while reducing manufacturing costs. The Si type also supports ultraviolet wavelengths starting from 185 nm.
- Measurement of mode hopping and mode competition
- Measurement of pulsed lasers for LiDAR
- Measurement of excimer lasers (193 nm) and sterilization light sources (222 nm)
- Laser characteristic inspection under varying temperature and current conditions within production takt time
- 100% inspection of LD chips
- Fault detection and quality improvement for laser light sources
Specifications
Please refer to the brochure for details.
Click here for the 950–1700 nm wavelength range model.
