High-resolution, real-time, high-speed measurement with a polychromator-based optical spectrum analyzer Multimode fiber input minimizes optical alignment effort
The SPG-V500 is a polychromator-based optical spectrum analyzer that can simultaneously measure spectral information (wavelength and intensity) over a defined wavelength range at high speed. It combines multimode fiber input with high resolution to streamline measurement tasks in laser R&D, assembly, alignment, and inspection.
Two model types are available: Si type (UV/VIS/NIR) and InGaAs type (NIR/SWIR).
Features
Capture instantaneous spectral behavior
Using the polychromator method, dispersed light is detected simultaneously at multiple wavelengths and at high speed with an image sensor. This enables continuous, simultaneous measurement of spectra over a defined wavelength range, allowing even instantaneous spectral changes to be captured. It supports mode-hop observation and pulsed laser measurement, making it useful for laser R&D and fault detection. Spectra can be acquired at intervals as short as the minimum integration time (Si type: 6 μs or more, InGaAs type: 21 μs or more)
Visualize spectra in real time
By continuously measuring multiple wavelengths at high speed, spectra can be visualized in real time. Adjustments can be made while monitoring the spectrum, and laser stability can be evaluated based on spectral changes caused by temperature or current fluctuations.
Shorten setup time and measurement time
With multimode fiber (MMF) input, precise optical alignment is not required, helping reduce setup time. In addition, because multiple wavelengths can be measured instantaneously, high-speed spectral measurement is possible. High resolution is maintained even with multimode fiber input, enabling efficient spectral measurement.
*The InGaAs type also supports single-mode fiber as standard.
Software for Visualizing Spectral Behavior
The system can be operated intuitively from a PC and includes a range of functions that support laser measurement.
Spectral behavior can be visualized easily, helping streamline result review and adjustment work. A control library DLL (C#) is provided, enabling customers to build their own application software. This makes it possible to develop software tailored to specific applications, such as automated measurement of current and temperature characteristics.
Line Up
Two model types are available: Si type (UV/VIS/NIR) and InGaAs type (NIR/SWIR).
・Wavelength range: 185–1095 nm
・High-speed measurement with wavelength resolution: ≦ 40 pm
・Wavelength range: 950–1700 nm
・High-speed measurement with wavelength resolution: ≦ 50 pm
・High dynamic range measurement (up to 60 dB) is available as an option.
Applications
The SPG-V500 enables high-resolution, real-time, high-speed measurement. Leveraging these features, it can be used for the following applications.
- Mode-hop measurement
Because it captures instantaneous spectral changes, it enables continuous measurement and recording from mode competition to the onset of mode hopping. Observing wavelength shifts caused by temperature or current changes helps analyze the causes of mode hops. It is also suitable for mode-hop inspection in laser manufacturing processes.
- Real-time spectrum monitoring
Adjustment work can be performed while visualizing spectral changes in real time. Because adjustment and measurement can proceed simultaneously, assembly and alignment tasks can be streamlined.
- Inspection automation
A control library DLL (C#) is provided, enabling integration with other equipment. Because multimode fiber input simplifies optical coupling, the system is well suited to automated inspection.
- High-speed measurement of side-mode suppression ratio (SMSR)
With the InGaAs type, the optional high dynamic range mode* enables measurement of side-mode suppression ratio (SMSR) up to 60 dB in less than one second.
*Optional feature
- Spectral measurement of UV laser light sources
The Si type covers a wavelength range of 185 nm to 1095 nm in a single unit. It can measure the spectra of laser light sources in the deep-UV region, including excimer lasers (193 nm).
Observation of mode hops and mode competition
- Suppression of Mode Hopping and Stabilization of Laser Output
- Side Peak Suppression of a Single-Frequency Laser
Measurement of Pulsed Light
Streamlining Laser Quality Evaluation and Inspection
- Automation of wavelength inspection for semiconductor lasers (LDs)
- Evaluation of current and temperature characteristics of laser spectra
- Detailed spectral inspection of LD bare chips
- 100% wavelength inspection of vertical-cavity surface-emitting lasers (VCSELs) and LiDAR sensors for autonomous driving
- Measurement of excimer lasers (193 nm)
- Continuous wavelength measurement of multi-wavelength laser sources
Reducing Laser Optical Alignment Time
- Speeding Up Adjustment Times for External Cavity Lasers
- Spectral Measurements of 266 nm-Laser (from Fundamental Wave to High-order Harmonics)
- Detecting Side Mode Behavior in Single-Mode Lasers
User Interview
